X-Rite i1 Xtreme, UV cut
Calumet # MO2366
Mfg. Part # EOXTRUV
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Product Specifications
Measurement modes
- Reflectance single measurement
- Reflectance scanning measurement with automatic patch detection
- Emission: radiance measurement (monitor measurement)
- Emission: irradiance measurement (light measurement)
Spectral analyzer
- Holographic diffraction grating with 128 pixel diode array
Optical resolution
Physical sampling interval
Spectral data
- Range: 380 ... 730 nm in 10nm steps
Measurement aperture
Interface
Physical dimensions
- Length 151mm, width 66mm, height 67mm (6 x 2.6 x 2.6 inches)
Weight
Measurement geometry
- 45°/0° ring illumination optics, DIN 5033
Light source
- Gas filled tungsten (Type A) No or UV cut (Filters not exchangeable)
Inter-instrument agreement
- Average DE*94 0.4, max. DE*94 1.0 (Deviation from X-Rite manufacturing standard at 23°C for single measurement mode on 12 BCRA tiles (D50,2°)
Short-term repeatability
- DE*94 <= 0.1 (D50,2°), with respect to the mean CIELab value of 10 measurements every 3 seconds on white
Data format
- Spectral radiance (mW/nm/m2 /sr); Luminance Y (cd/m2)
Measurement range
Short-term repeatability
- x,y: +/- 0.002 typical (CRT 5000°K, 80 cd/m2)
Type
- Cosine-corrected diffuse light measurement head
Diameter
Data format
- Spectral irradiance (mw/nm/m2), Illuminance Y (lux)
Power supply
- Device powered by USB. USB 1.1 high power device
i1 Ruler
i1 Ruler Board
- 35.5 cm X 26.5 cm folded, 35.5 cm X 40 cm unfolded
Mac System Requirements
- Power Mac G3 or higher, 300 MHz Mac OS X 10.3 or later
- 128 MB of available RAM
- 100 MB of available hard disk space
- USB Support
Windows System Requirements
- PC with 300MHz
- Windows 2000, XP, Vista
- 128 MB of available RAM
- 100 MB of available hard disk space
- USB Support
